JaCoW Logo

Reference Search

Author: P. Peier


References



Reference
M. Felber et al., “New MTCA.4-based Hardware Developments for the Control of the Optical Synchronization Systems at DESY”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD07, pp. 152-156.
M. J. Nasse et al., “Status of the Accelerator Physics Test Facility FLUTE”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1506-1508.
N. Hiller et al., “A Setup for Single Shot Electro Optical Bunch Length Measurements at the ANKA Storage Ring”, in Proc. 2nd Int. Particle Accelerator Conf. (IPAC'11), San Sebastian, Spain, Sep. 2011, paper TUPC086, pp. 1206-1208.
N. Hiller et al., “Electro-optical Bunch Length Measurements at the ANKA Storage Ring”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPME014, pp. 500-502.
N. Hiller et al., “Single-Shot Electro-Optical Diagnostics at the ANKA Storage Ring”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD17, pp. 182-186.
N. Hiller et al., “Status of Single-shot EOSD Measurement at ANKA”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 1909-1911.
N. M. Lockmann, C. Gerth, P. Peier, B. Schmidt, and S. Wesch, “A Non-Invasive THz Spectrometer for Bunch Length Characterization at European XFEL”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2495-2497.
P. Chevtsov, F. Mueller, V. Schlott, D. M. Treyer, P. Peier, and B. Steffen, “Electro Optical Beam Diagnostics System and its Control at PSI”, in Proc. 13th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'11), Grenoble, France, Oct. 2011, paper MOPKS019, pp. 195-198.
P. N. Juranic et al., “PALM Concepts and Considerations”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 848-851.
P. N. Juranic et al., “THz Streak Camera for FELTemporal Diagnostics: Concepts and Considerations”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THA01, pp. 640-643.


Back to the list