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Author: M. Yan


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Reference
J. Wychowaniak, C. Gerth, and M. Yan, “Design of TDS-based Multi-screen Electron Beam Diagnostics for the European XFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP075, pp. 909-912.
M. Yan, B. Beutner, C. Gerth, R. Ischebeck, and E. Prat, “Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP088, pp. 941-944.
T. Boltz et al., “Feedback Design for Control of the Micro-Bunching Instability based on Reinforcement Learning”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 104-107.
T. Boltz et al., “Perturbation of Synchrotron Motion in the Micro-Bunching Instability”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 108-111.
M. J. Nasse et al., “First Electron Beam at the Linear Accelerator FLUTE at KIT”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 882-884.
T. Schmelzer et al., “Diagnostics and First Beam Measurements at FLUTE”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2484-2486.
T. Boltz et al., “Excitation of Micro-Bunching in Short Electron Bunches Using RF Amplitude Modulation”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 3173-3176.


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