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Author: J. Rönsch-Schulenburg


References



Reference
J. W. B?ñhr et al., “Recent Upgrade of the PITZ Facility”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM103, pp. 459-463.
F. Curbis et al., “Characterization of Seeded FEL Pulses at FLASH: Status, Challenges and Opportunities”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper TUPB21, pp. 298-301.
J. B?Âdewadt et al., “sFLASH - First Results of Direct Seeding at FLASH”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEOAI2, pp. 330-335.
M. A. Khojoyan et al., “Measurement and Simulation Studies of Emittance for Short Gaussian Pulses at PITZ”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB06, pp. 402-405.
S. Rimjaem et al., “Measurements and Simulations of Emittance for Different Bunch Charges at PITZ”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB09, pp. 410-413.
R. Tarkeshian et al., “Femtosecond Temporal Overlap of Injected Electron Beam and EUV Pulse at sFLASH”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPD091, pp. 915-917.
H. Delsim-Hashemi et al., “Status of sFLASH, the Seeding Experiment at FLASH”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE009, pp. 2161-2163.
G. Asova et al., “Status of the Photo Injector Test Facility at DESY, Zeuthen Site (PITZ)”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE010, pp. 2164-2166.
S. Rimjaem et al., “Generating Low Transverse Emittance Beams for Linac Based Light Sources at PITZ”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE011, pp. 2167-2169.
M. Krasilnikov et al., “Recent Electron Beam Measurements at PITZ with a New Photocathode Laser System”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper MO6RFP057, pp. 491-493.


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