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Author: G. P. Williams


References



Reference
S. V. Benson, D. Douglas, G. Neil, M. D. Shinn, and G. P. Williams, “A Synchronized FIR/VUV Light Source at Jefferson Lab”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP086, pp. 1789-1791.
D. Douglas et al., “High Average Power UV Free Electron Laser Experiments at JLAB”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEYB03, pp. 2111-2115.
A. Ratti et al., “Design Concepts for the NGLS Linac”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPWA068, pp. 2271-2273.
S. Zhang et al., “Aperture Test for Internal Target Operation in the JLAB High-current ERL”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPWA077, pp. 2289-2291.
F. E. Hannon et al., “JLAMP: A Next Generation Photon Science Facility at Jefferson Laboratory”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC70, pp. 169-171.
D. Douglas et al., “Use Of Multipass Recirculation And Energy Recovery In CW SRF X-FEL Driver Accelerators”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper TUOA4, pp. 193-196.
S. V. Benson et al., “Beam Line Commissioning of a UV/VUV FEL at Jefferson Lab”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper WEOCI1, pp. 326-330.
A. Ratti et al., “RF Design Approach for an NGLS Linac”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO12, pp. 226-228.
F. E. Hannon et al., “The JLAMP VUV/Soft x-ray User Facility at Jefferson Laboratory”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUPE074, pp. 2302-2304.
S. V. Benson et al., “Demonstration of 3D Effects with High Gain and Efficiency in a UV FEL Oscillator”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper THP171, pp. 2429-2431.


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