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Author: M. Witthaus


References



Reference
P. Forck et al., “Beam-based Tests of Intercepting Transverse Profile Diagnostics for FAIR”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 3480-3482.
A. Reiter et al., “Beam Instrumentation for CRYRING@ESR”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2084-2087.
M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.
M. Witthaus et al., “SEM-GRID Prototype Electronics using Charge-Frequency-Converters”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper MOPD55, pp. 176-178.
T. Sieber et al., “Beam Diagnostics Layout for the FAIR Proton Linac”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper THPP063, pp. 998-1000.
F. Stulle et al., “Beam Loss and Average Beam Current Measurements Using a CWCT”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 882-885.


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