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Author: M. Gaowei


References



Reference
G. I. Bell et al., “Simulations of Diamond Detectors with Schottky Contacts”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 617-619.
M. Gaowei, J. Smedley, E. M. Muller, T. Zhou, and A. V. Sumant, “Responsivity Study of Diamond X-ray Monitors with nUNCD Contact”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1273-1275.
J. Smedley et al., “Sputter Growth of Alkali Antimonide Photocathodes: An in Operando Materials Analysis”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 1965-1967.
S. G. Schubert et al., “CsK2Sb Growth Studies: Towards High Quantum Efficiency and Smooth Surfaces”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 2566-2568.
Z. Ding et al., “Improving the Smoothness of Multialkali Antimonide Photocathodes: An In-Situ X-Ray Reflectivity Study”, in Proc. 56th Advanced ICFA Beam Dynamics Workshop on Energy Recovery Linacs (ERL'15), Stony Brook, NY, USA, Jun. 2015, pp. 27-29.
J. Smedley et al., “Diamond X-ray Beam Position Monitors”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper MOP207, pp. 483-485.
T. Xin et al., “Diamond Amplifier Design and Preliminary Test Results”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC34, pp. 1211-1213.
G. I. Bell et al., “Simulations of Hole Injection in Diamond Detectors”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 1184-1186.
D. Kayran et al., “Commissioning of the Electron Accelerator LEReC for Bunched Beam Cooling”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 330-334.
A. V. Fedotov et al., “First Electron Cooling of Hadron Beams Using a Bunched Electron Beam”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 957-960.


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