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Author: L. F. Han


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Reference
Y. Z. Chen et al., “Beam Diagnostic at SDUV-FEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper FROA3, pp. 711-713.
Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, “A New Beam Profile Diagnostic System based on the Industrial Ethernet”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPE033, pp. 1044-1046.


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