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Author: F. Schäfers


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Reference
R. Cimino and F. Sch?ñfers, “Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2335-2337.
J. Bahrdt, W. Frentrup, A. Gaupp, M. Scheer, F. Sch?ñfers, and G. W??stefeld, “Mini-beta Sections in the Storage Ring BESSY II”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPD011, pp. 3108-3110.


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