|
M. Stadler et al., “Low-Q Cavity BPM Electronics for E-XFEL, FLASH-II and SwissFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper WEPD12, pp. 670-674. |
|
M. Stadler et al., “Development of the SwissFEL Undulator BPM System”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper WEPD13, pp. 675-679. |
|
W. Koprek, B. Keil, and G. Marinkovic, “Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 165-169. |
|
P. Pollet, R. Ischebeck, D. Llorente Sancho, G. Marinkovic, C. Ozkan Loch, and V. Schlott, “System Integration of SwissFEL Beam Loss Monitors”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 170-174. |
|
B. Keil et al., “Status of The European XFEL Transverse Intra Bunch Train Feedback System”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 492-496. |
|
B. Keil et al., “Status of The SwissFEL BPM System”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 497-501. |
|
D. Lipka et al., “First Experience with the Standard Diagnostics at the European XFEL Injector”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 14-19. |
|
C. Simon et al., “Design and Beam Test Results of the Reentrant Cavity BPM for the European XFEL”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 356-359. |
|
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108. |
|
B. Keil et al., “First Beam Commissioning Experience With The SwissFEL Cavity BPM System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 251-254. |
