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I. Zagorodnov, M. Dohlus, E. Gjonaj, M. Krasilnikov, and S. Schnepp, “Transverse Effects due to Vacuum Mirror of RF Gun”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPP034, pp. 1613-1615. |
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A. V. Tsakanian, M. Dohlus, and I. Zagorodnov, “Numerical Studies of Resistive Wall Effects”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPP075, pp. 1709-1711. |
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I. Zagorodnov and M. Dohlus, “Numerical FEL Studies with a new Code Alice”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper MOPC16, pp. 71-74. |
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C. Behrens, C. Gerth, and I. Zagorodnov, “Numerical Performance Studies on the new Sliced-Beam-Parameter Measurement Section for FLASH”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEPC45, pp. 599-602. |
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I. Zagorodnov, “Ultra-Short Low Charge Operation at FLASH and the European XFEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEOBI2, pp. 345-352. |
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I. Zagorodnov and M. Dohlus, “Multistage Bunch Compression”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB30, pp. 464-466. |
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W. Decking, G. Geloni, V. Kocharyan, E. Saldin, and I. Zagorodnov, “Scheme for Generating and Transporting THz Radiation to the X-ray Experimental Hall at the European XFEL”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper WEPD09, pp. 389-392. |
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V. Kocharyan, G. Geloni, E. Saldin, S. Serkez, I. Zagorodnov, and O. Yefanov, “Proposal for a Scheme to Generate a 10 tw Power Level, Femtosecond X-ray Pulses for Bio-imaging of Single Protein Molecules at the European XFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper WEPSO34, pp. 574-582. |
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S. Serkez, V. Kocharyan, E. Saldin, I. Zagorodnov, G. Geloni, and O. Yefanov, “Extension of SASE Bandwidth up to 2 % as a Way to Increase Number of Indexed Images for Protein Structure Determination by Femtosecond X-Ray Nanocrystallography at the European XFEL”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper WEPSO63, pp. 661-666. |
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I. V. Agapov et al., “SASE Characteristics from Baseline European XFEL Undulators in the Tapering Regime”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP056, pp. 159-163. |
