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Author: G. Kim


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Reference
T. Ha, S. H. Kim, C. D. Park, S. Shin, G. Kim, and H. K. Park, “Introduction to 3D Printing Techniques for Accelerator Vacuum Systems”, in Proc. 11th Int. Particle Accelerator Conf. (IPAC'20), Caen, France, May 2020, paper THVIR11, pp. XX-XX.
S.-W. Jang et al., “Beam diagnostics status for the Korea 4GSR project”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPG70, this conference.
S. Y. Baek et al., “Network status for PAL-XFEL”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper TUPR84, this conference.
S. W. Jang et al., “Developments of 4GSR BPM Electronics”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper MOP030, pp. 87-89.
S. Serkez et al., “Generating Trains of Attosecond Pulses with a Free-Electron Laser”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 692-694.
P. McIntyre, G. Kim, D. May, and A. Sattarov, “A Superconducting Isochronous Cyclotron Stack as a Driver for a Thorium-Cycle Power Reactor”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper WPPH062, pp. 2593-2595.
M. H. Cho, H.-S. Kang, G. Kim, C. H. Shim, and H. Yang, “Effect on FEL Gain Curve Using Phase Shifters”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 203-205.
J. Wu et al., “Slippage-Enhanced SASE FEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 348-351.
J. Lee et al., “Bunch by Bunch Position Measurement and Analysis at PLS-II”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 232-234.
J. Kim, G. Kim, and S. H. Yoo, “Density Structure Effect on the Electron Energy in Laser Wakefield Accelerator”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPEC007, pp. 4068-4070.


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