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Author: R. Niemczyk


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Reference
P. W. Huang et al., “Test of Cs2Te Thickness on Cathode Performance at PITZ”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 473-476.
R. Niemczyk et al., “Comparison of YAG Screens and LYSO Screens at PITZ”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 438-440.
R. Niemczyk et al., “Experimental Slice Emittance Reduction at PITZ Using Laser Pulse Shaping”, presented at the 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, paper THOYGD2, unpublished.
R. Niemczyk et al., “Proof-of-Principle Tests for Slit-scan-based Slice Emittance Measurements at PITZ”, in Proc. 29th Linear Accelerator Conf. (LINAC'18), Beijing, China, Sep. 2018, pp. 553-556.
R. Niemczyk et al., “Slit-Based Slice Emittance Measurements Optimization at PITZ”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 318-321.
R. Niemczyk, A. Arnold, J. M. Klopf, J. Teichert, R. Xiang, and U. Lehnert, “Simulation of electrom beams from the ELBE superconducting RF gun for ultrafast electron diffraction experiments”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPC49, this conference.
R. Xiang et al., “Experimental investigations and Simulations of Dark Current in ELBE SRF gun-II”, presented at the 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUPA004, unpublished.
S. Khan et al., “Pilot Experiments and New Developments at the DELTA Short-Pulse Facility”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 2578-2581.
S. Khan et al., “Seeding of Electron Bunches in Storage Rings”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 94-97.
S. Khan et al., “Spectral Studies of Ultrashort and Coherent Radiation Pulses at the DELTA Storage Ring”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2851-2854.


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