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Author: J. Fitzgerald


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Reference
X.-L. Zhang et al., “Beam Diagnostics for Tevatron Electron Lens”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper WPAH094, pp. 2305-2307.
X. L. Zhang et al., “Upgrades of the Tevatron Electron Lens”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper TPPB077, pp. 1781-1783.
W. Chou et al., “Operational Aspects of the Main Injector Large Aperture Quadrupole”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper TUPAS015, pp. 1685-1687.
R. M. Thurman-Keup, M. L. Alvarez, J. Fitzgerald, C. E. Lundberg, P. S. Prieto, and W. Blokland, “Electron Beam Profiler for the Fermilab Main Injector”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPD02, pp. 398-402.
R. M. Thurman-Keup et al., “Installation Status of the Electron Beam Profiler for the Fermilab Main Injector”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 535-539.
R. M. Thurman-Keup et al., “Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 330-334.
P. Stabile et al., “Beam Position Monitor Electronics Upgrade for Fermilab Switchyard”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPF19, pp. 365-368.
N. Patel et al., “Beam Position Monitoring System for the PIP-II Injector Test Accelerator”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 349-351.
K. Meisner, H. Edwards, J. Fitzgerald, and Q. Kerns, “A Low Level RF System for the Fermilab Tevatron”, in Proc. 11th Particle Accelerator Conf. (PAC'85), Vancouver, Canada, May 1985, pp. 1687-1690.
J. Fitzgerald and R. Gonzalez, “Tune Trackers for the Fermilab Tevatron”, in Proc. 14th Particle Accelerator Conf. (PAC'91), San Francisco, CA, USA, May 1991, pp. 1252-1255.


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