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Author: S. A. K. Wijethunga


References



Reference
S. A. K. Wijethunga et al., “Simulation Study of the Magnetized Electron Beam”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 3395-3397.
M. A. Mamun et al., “Production of Magnetized Electron Beam from a DC High Voltage Photogun”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4567-4570.
Y. W. Wang et al., “300 kV DC High Voltage Photogun with Inverted Insulator Geometry and CsK2sb Photocathode”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4571-4574.
R. Suleiman et al., “Magnetized Electron Source for JLEIC Cooler”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 83-86.
S. A. K. Wijethunga et al., “Space Charge Study of the Jefferson Lab Magnetized Electron Beam”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 360-362.
S. A. K. Wijethunga et al., “Simulation Study of the Emittance Measurements in Magnetized Electron Beam”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 822-825.
S. Zhang et al., “High Current High Charge Magnetized and Bunched Electron Beam from a DC Photogun for JLEIC Cooler”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2167-2170.
S. A. K. Wijethunga et al., “Redesign of the Jefferson Lab -300 kV DC Photo-Gun for High Bunch Charge Operations”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2802-2805.
S. A. K. Wijethunga et al., “Space Charge Effects in Low Energy Magnetized Electron Beam”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2806-2809.
J. T. Yoskowitz et al., “Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2840-2842.


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