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Author: Y. P. Sun


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Reference
Y. P. Sun and M. Borland, “Comparison of Nonlinear Dynamics Optimization Methods for APS-U”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 924-927.
K. C. Harkay et al., “Operational Experience with Superconducting Undulators at APS”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 57-62.
Y. P. Sun, “Optimized Linear and Second Order Chromaticity Setpoints for the Advanced Photon Source Upgrade”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 70-73.
Y. P. Sun, “Correlations Between Beta Beating and APS-U Single Particle Dynamics Performance”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 95-97.
M. Borland, J. C. Dooling, R. R. Lindberg, V. Sajaev, and Y. P. Sun, “Simulation of Beam Aborts for the Advanced Photon Source to Probe Material-Damage Limits for Future Storage Rings”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 106-109.
J. C. Dooling et al., “Studies of Beam Dumps in Candidate Horizontal Collimator Materials for the Advanced Photon Source Upgrade Storage Ring”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 128-131.
Y. P. Sun and C. Yao, “Tracking With Space Harmonics in ELEGANT Code”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 892-894.
Y. P. Sun, “Linear and Second Order Map Tracking with Artificial Neural Network”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 895-897.
Y. P. Sun, “Transfer Matrix Classification with Artificial Neural Network”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 898-900.
J. C. Dooling et al., “Diagnostics for Collimator Irradiation Studies in the Advanced Photon Source Storage Ring”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 26-33.


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