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Author: J. N. Yan
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J. N. Yan
et al.
, “Measurement of Nanometer Electron Beam Sizes with Laser Interference using IPBSM”, in
Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12)
, Tsukuba, Japan, Oct. 2012, paper TUCC04, pp. 310-314.
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