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Author: J. N. Yan


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Reference
J. N. Yan et al., “Measurement of Nanometer Electron Beam Sizes with Laser Interference using IPBSM”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUCC04, pp. 310-314.


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