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Author: C. Ozkan Loch


References



Reference
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.
R. Ganter et al., “Status of Athos, the Soft X-Ray FEL Line of SwissFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 753-756.
R. Ganter et al., “SLS 2.0 storage ring components overview before installation”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPM020, pp. 1023-1026.
P. Pollet, R. Ischebeck, D. Llorente Sancho, G. Marinkovic, C. Ozkan Loch, and V. Schlott, “System Integration of SwissFEL Beam Loss Monitors”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 170-174.
N. Samadi, G. Lovric, C. Ozkan Loch, and X. Shi, “An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 366-369.
M. Aiba et al., “Exploring the Potential of the Swiss Light Source”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 1554-1556.
G. Penco et al., “Beam Optics Measurements at FERMI by using Wire-Scanner”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 101-104.
G. L. Orlandi, R. Ischebeck, C. Ozkan Loch, V. Schlott, M. Ferianis, and G. Penco, “Design and Experimental Tests of the SwissFEL Wire-Scanners”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 225-228.
G. L. Orlandi et al., “Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 307-310.
G. L. Orlandi et al., “First Experimental Results of the Commissioning of the SwissFEL Wire-Scanners”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 388-392.


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