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Author: M. C. Mann

	Reference
	D. T. Button, D. B. Garton, M. C. Mann, and S. Yan, “Advancements in the Management Measurements & Visualisation of NEC Beam Profile Monitors”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 298-301.

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