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Author: M. Baldinger


References



Reference
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.
G. L. Orlandi et al., “Design and Test of Wire-Scanners for SwissFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP091, pp. 948-951.


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