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Author: S. Serkez


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Reference
S. Serkez, Y. Ding, Z. Huang, and J. Krzywinski, “Soft X-ray Self-seeding Simulation Methods and their Application for LCLS”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP090, pp. 264-268.
S. D. Chen et al., “Mode Contents Analysis of a Tapered Free Electron Laser”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper TUP028, pp. 437-441.
K. Fang et al., “Mode Component Evolution and Coherence Analysis in Terawatt Tapered FEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper TUP030, pp. 446-450.
O. V. Chubar et al., “Novel Opportunities for Sub-meV Inelastic X-Ray Scattering Experiments at High-Repetition Rate Self-seeded XFELs”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 257-262.
G. Geloni et al., “Status of the Hard X-Ray Self-Seeding Project at the European XFEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 42-45.
S. Serkez, G. Geloni, V. Kocharyan, T. Mazza, M. Meyer, and E. Saldin, “Opportunities for Two-Color Experiments at the SASE3 Undulator Line of the European XFEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 121-124.
S. Liu et al., “Longitudinal Phase Space Optimization for the Hard X-ray Self-Seeding”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 259-262.
S. Serkez, G. Geloni, and E. Saldin, “Interference-Based Ultrafast Polarization Control at Free Electron Lasers”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 329-332.
E. Schneidmiller et al., “Harmonic Lasing Experiment at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 29-32.
T. Tanikawa et al., “A Superradiant THz Undulator Source for XFELs”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 48-51.


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