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Author: M. Calvi


References



Reference
P. Boehler et al., “Experience With the Commissioning of the U15-Undulator for SwissFEL-Aramis Beamline and New Developments for the Athos Beamline”, in Proc. 9th Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation Conf. (MEDSI'16), Barcelona, Spain, Sep. 2016, pp. 283-287.
R. Ganter et al., “Overview of the Soft X-Ray Line Athos at SwissFEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 125-128.
R. Ganter et al., “Status of Athos, the Soft X-Ray FEL Line of SwissFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 753-756.
R. Ganter et al., “Status of SwissFEL Undulator Lines”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper TUPSO22, pp. 263-266.
R. Ischebeck et al., “Overview of Beam Instrumentation Activities for SwissFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF31, pp. 119-123.
S. K. Karabekyan et al., “SASE3 Variable Polarization Project at the European XFEL”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 1678-1680.
S. Karabekyan et al., “Status update of the SASE3 variable polarization project at the European XFEL”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPG30, this conference.
S. Karabekyan et al., “The Status of the SASE3 Variable Polarization Project at the European XFEL”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1029-1032.
T. Schmidt et al., “Experience with Short-Period, Small Gap Undulators at the SwissFEL Aramis Beamline”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 564-568.
T. Schmidt et al., “Magnetic Design of an Apple III Undulator for SwissFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper MOP043, pp. 116-120.


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