|
S. Zhang et al., “Aperture Test for Internal Target Operation in the JLAB High-current ERL”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPWA077, pp. 2289-2291. |
|
D. Douglas et al., “Use Of Multipass Recirculation And Energy Recovery In CW SRF X-FEL Driver Accelerators”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper TUOA4, pp. 193-196. |
|
S. V. Benson et al., “Beam Line Commissioning of a UV/VUV FEL at Jefferson Lab”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper WEOCI1, pp. 326-330. |
|
S. V. Benson et al., “Demonstration of 3D Effects with High Gain and Efficiency in a UV FEL Oscillator”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper THP171, pp. 2429-2431. |
|
C. Tennant et al., “Operation and Commissioning of the Jefferson Lab UV FEL using an SRF Driver ERL”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper THP172, pp. 2432-2434. |
|
C. Tennant et al., “Design of the SRF Driver ERL for the Jefferson Lab UV FEL”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper THP173, pp. 2435-2437. |
|
M. Stirbet et al., “High Power RF Tests on WR650 Pre-Stressed Planar Windows”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper THPPO056, pp. 723-727. |
|
S. V. Benson et al., “High Power Operation of the JLab IR FEL Driver Accelerator”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper MOOAAB03, pp. 79-81. |
|
S. V. Benson et al., “Recent Results from the IR Upgrade FEL at Jefferson Lab”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOOB004, pp. XX-XX. |
|
C. Hernandez-Garcia et al., “A High Average Current DC GaAs Photocathode Gun for ERLs and FELs”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP050, pp. 3117-3119. |