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J. F. DeFord, N. J. Dionne, S. G. Ovtchinnikov, and J. J. Petillo, “Inclusion of Surface Roughness Effects in Emission Modeling With the MICHELLE Code”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper WEP160, pp. 1788-1790. |
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J. J. Petillo et al., “The MICHELLE 2D/3D ES PIC Code: Advances and Applications”, presented at the 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAT043, unpublished. |
