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Author: B. Voss


References



Reference
M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.
M. Luoma et al., “Development of a New Clusterization Method for the GEM-TPC Detector”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 233-236.
T. Sieber et al., “Measurement of nanoampere beam intensities at FAIR”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 1-7.
S. Kolbe, F. Römer, T. Sieber, V. Tympel, and B. Voß, “Systematic analysis and mitigation of disturbances in beam current measurements using dual SQUID readout”, presented at the 17th Int. Particle Accelerator Conf. (IPAC'26), Deauville, France, May 2026, paper WEP6044, this conference.


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