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Author: J. E. Shipman


References



Reference
G. R. Werner, H. Padamsee, D. P. Lundberg, A. S. Romanenko, J. E. Shipman, and L. T. Ying, “Voltage Breakdown and the Processing Mechanism”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper WEO12, pp. 551-554.
G. R. Werner et al., “Investigation of Voltage Breakdown Caused by Microparticles”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper MPPH127, pp. 1071-1073.
G. R. Werner et al., “Voltage Breakdown on Niobium and Copper Surfaces”, in Proc. 10th Workshop RF Superconductivity (SRF'01), Tsukuba, Japan, Sep. 2001, paper MA005, pp. XX-XX.


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