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Author: F. Laviano


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Reference
D. Tonini et al., “Morphology of Niobium Films Sputtered at Different Target-Substrate Angle”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper THP11, pp. 614-621.
C. Bonavolonta, F. Laviano, V. Palmieri, and M. Valentino, “Application of Flux Gate Magnetometry to Electropolishing”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper TUP25, pp. 351-356.


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