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Author: F. Laviano


References



Reference
C. Bonavolonta, F. Laviano, V. Palmieri, and M. Valentino, “Application of Flux Gate Magnetometry to Electropolishing”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper TUP25, pp. 351-356.
D. Tonini et al., “Morphology of Niobium Films Sputtered at Different Target-Substrate Angle”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper THP11, pp. 614-621.


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