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Author: M. J. H. Luttikhof


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Reference
P. J. M. van der Slot et al., “Real-Time Ellipsometry for Monitoring the Growth of Cesium-Telluride Photocathodes”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH087, pp. 448-451.


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