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Author: E. Wappler


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Reference
W. Singer, A. Brinkmann, F. Sch?Âlz, A. Farr, E. Wappler, and M. M??ck, “SQUID-Based Scanning System for Detecting Defects in Nb Sheets for RF Cavities”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper TUP49, pp. 359-359.


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