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Author: J. R. Roensch


References



Reference
F. Marhauser et al., “A High Average Power RF-Photoinjector Gun Cavity Developed for the BESSY Soft X-ray FEL”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH003, pp. 560-563.
J. R. Roensch et al., “Investigations of Longitudinal Beam Properties at the Photoinjector Test Facility in Zeuthen”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH019, pp. 597-600.
S. Khodyachykh et al., “Design of the Multipurpose Dispersive Section at PITZ”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH020, pp. 601-604.
A. Oppelt et al., “Upgrade of the PITZ Facility and First Beam Measurements”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH022, pp. XX-XX.
A. Oppelt et al., “Tuning, Conditioning, and Dark Current Measurements of a New Gun Cavity at PITZ”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THPPH023, pp. 609-612.
L. Staykov et al., “Commissioning of a New Emittance Measurement System at PITZ”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper TUPPH067, pp. 474-476.
J. R. Roensch et al., “Investigations of the Longitudinal Phase Space at PITZ”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPLS103, pp. 3517-3519.
J. W. Baehr et al., “Upgrades of the Laser Beam-line at PITZ”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP034, pp. XX-XX.
J. R. Roensch et al., “Longitudinal Phase Space Studies at PITZ”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP040, pp. XX-XX.
A. Oppelt et al., “Status and First Results from the Upgraded PITZ Facility”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP043, pp. XX-XX.


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