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Author: R. Olsen


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Reference
L. Arnaudon, S. Myers, and R. Olsen, “Commissioning of the LEP Transverse Feedback System”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 901-904.
L. Arnaudon, S. Myers, R. Olsen, and E. Peschardt, “Transverse Feedback and LEP Performance”, in Proc. 3rd European Particle Accelerator Conf. (EPAC'92), Berlin, Germany, Mar. 1992, pp. 66-69.
L. Arnaudon et al., “Recent Achievements in Transverse Spin-Polarisation at LEP”, in Proc. 4th European Particle Accelerator Conf. (EPAC'94), London, UK, Jun.-Jul. 1994, pp. 187-190.
R. Olsen, “Digital Trigger Generator for a 24-Pulse SCR Bridge with Controllable, Line-Commutated Free-Wheeling Thyristors”, in Proc. 4th European Particle Accelerator Conf. (EPAC'94), London, UK, Jun.-Jul. 1994, pp. 2344-2347.
J.-Y. Hemery, F. Lemeilleur, R. Olsen, and K. Potter, “Background and Luminosity Monitoring at the CERN ISR”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 3034-3037.
S. Myers, R. Olsen, and I. Wilson, “Hardware for the LEP Transverse Feedback System”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 751-754.
R. Olsen and H. Langenbach, “High Precision Power Supplies for the National Synchrotron Light Source”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 1408-1410.
A. Butterworth, L. Arnaudon, G. Beetham, E. Ciapala, J.-C. Juillard, and R. Olsen, “The LEP RF Trip and Beam Loss Diagnostics System”, in Proc. 8th European Particle Accelerator Conf. (EPAC'02), Paris, France, Jun. 2002, paper MOPDO027, pp. 2004-2006.
P. Baudrenghien et al., “The LHC Low Level RF”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper TUPCH195, pp. 1471-1473.
J. C. Molendijk et al., “Digital Design of the LHC Low Level RF: the Tuning System for the Superconducting Cavities”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper TUPCH196, pp. 1474-1476.


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