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Author: M. Weichold


References



Reference
J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 1537-1540.


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