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Author: C. Scheuerlein


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Reference
V. Baglin et al., “The Secondary Electron Yield of Technical Materials and its Variaton with Surface Treatments”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper THXF102, pp. 217-221.
N. Hilleret, B. Henrist, C. Scheuerlein, M. Taborelli, and G. Vorlaufer, “The Variation of the Secondary Electron Yield and of the Desorption Yield of Copper under Electron Bombardment: Origin and Impact on the Conditioning of LHC”, in Proc. 8th European Particle Accelerator Conf. (EPAC'02), Paris, France, Jun. 2002, paper WEPDO014, pp. 2553-2555.


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