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Author: S. Oishi


References



Reference
M. Fujisawa et al., “Reduction In Resistive-Wall Impedance of Insertion-Device Vacuum Chamber By Copper Coating”, in Proc. 6th European Particle Accelerator Conf. (EPAC'98), Stockholm, Sweden, Jun. 1998, paper THP10H, pp. 984-986.
Y. Tsuzuki et al., “Polarimetry of Hard X-Rays from Highly Charged Ions Using a Si/CdTe Compton Camera”, presented at the 14th International Symposium of EBIS/T (EBIST2022), Whistler, BC, Canada, Jun. 2022, paper FR3WH01, unpublished.


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