JaCoW Logo

Reference Search

Author: Y. Leng


References



Reference
Y. Leng and L. Hoff, “Analog I/O Module Test System Based on EPICS CA Protocol and ActiveX CA Interface”, in Proc. 9th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'03), Gyeongju, Korea, Oct. 2003, paper MP529, pp. XX-XX.
Y. Leng, D. Gassner, L. Hoff, and R. Witkover, “Data Acquisition for SNS Beam Loss Monitor System”, in Proc. 9th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'03), Gyeongju, Korea, Oct. 2003, paper WP576, pp. XX-XX.
Y. Zhou, S. Wu, F. Chen, N. Zhang, and Y. Leng, “Turn-by-turn beam size measurement based on spatial interferometer”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper THPL178, pp. 4869-4872.
J. Chen, S. Cao, L. Lai, Y. Leng, R. Yuan, and R. Jiang, “Optimization and development of the CBPM system for the SHINE”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper THPL183, pp. 4876-4878.
S. Cao, L. Lai, J. Chen, and Y. Leng, “BAM system and machine stability at SXFEL”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper THPL177, pp. 4866-4868.
L. Hua, X. Liu, R. Yuan, L. Yu, and Y. Leng, “R&D of EOTD bunch length monitor for SXFEL”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPG80, unpublished.
C. Liu, Y. Leng, X. Yang, and Y. Deng, “PREDICTION OF FEL PERFORMANCE USING BPM MEASUREMENTS AND MACHINE LEARNING”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 50-54.
A. Wang, X. Yang, Y. Deng, J. Chen, and Y. Leng, “Bunch-by-bunch beam current and lifetime measurement with interleaved sampling at HLS”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 159-163.
Y. Xiao, Y. Liu, and Y. Leng, “Joint analysis of beam loss and beam position during the injection process at Hefei light source”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 215-219.
X. Gao and Y. Leng, “Development of an optical simulation toolkit for transverse beam profile characterization”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 558-562.


Back to the list