|
A. Murokh, J. B. Rosenzweig, I. Ben-Zvi, X. J. Wang, and V. Yakimenko, “Limitations on Measuring a Transverse Profile of Ultra-Dense Electron Beams with Scintillators”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper TPAH049, pp. 1333-1335. |
|
A. Murokh et al., “Measuring FEL Radiation Properties at VISA-FEL”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper WPPH118, pp. 2748-2750. |
|
A. Tremaine et al., “Saturation Measurements of a Visible SASE FEL”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper WPPH122, pp. 2760-2762. |
|
G. Andonian et al., “Design and Status of the VISA II Experiment”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper MPPB057, pp. 944-946. |
|
A. Murokh, “Tunneling Ionization Bunch Length Monitor for the Ultrarelativistic Compressed Electron Beams”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper WPPB071, pp. 2568-2570. |
|
A. Tremaine et al., “A Measurement of High Gain SASE FEL Induced Electron Beam Micro-Bunching using Coherent Transition Radiation”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper TUDL4, pp. 217-220. |
|
S. Anderson et al., “Commissioning of the Neptune Photoinjector”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper WEA53, pp. 2006-2008. |
|
A. Murokh et al., “Photon Beam Diagnostics for VISA FEL-”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper WEP94, pp. 2480-2482. |
|
M. Hogan et al., “Measurements of High Gain and Noise Fluctuations in a SASE Free Electron Laser”, in Proc. 17th Particle Accelerator Conf. (PAC'97), Vancouver, Canada, May 1997, paper 4B011, pp. 736-738. |
|
G. Andonian et al., “VISA IB: Ultra-High Bandwidth, High Gain SASE FEL”, in Proc. 26th Int. Free Electron Laser Conf. & 11th FEL Users Workshop (FEL'04), Trieste, Italy, Aug.-Sep. 2004, paper THPOS56, pp. XX-XX. |
