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Author: T. Shen


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Reference
T. Shen, D. Arbelaez, L. Garcia Fajardo, D. Leitner, S. Prestemon, and G. L. Sabbi, “HTS Magnet Technology as Path to Fourth and Fifth Generation ECR Ion Sources”, in Proc. 23th International Workshop on ECR Ion Sources (ECRIS'18), Catania, Italy, Sep. 2018, pp. 97-101.
L. W. Lai et al., “Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 17-20.
J. Wei et al., “FRIB Beam Power Ramp-up: Status and Plans”, in Proc. HB'23 (HB), Geneva, Switzerland, Oct. 2023, paper THC1I2, pp. 351-357.


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