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Author: Z. Perduk


References



Reference
S. Biri et al., “Multi-Diagnostic Setup to Investigate the Two-Close-Frequency Phenomena”, in Proc. 23th International Workshop on ECR Ion Sources (ECRIS'18), Catania, Italy, Sep. 2018, pp. 115-119.
R. R?â et al., “Effect of the Two-Close-Frequency Heating to the Extracted Ion Beam and to the X-Ray Flux Emitted by the ECR Plasma”, in Proc. 23th International Workshop on ECR Ion Sources (ECRIS'18), Catania, Italy, Sep. 2018, pp. 165-169.
E. Naselli et al., “Impact of the Two Close Frequency Heating on ECRIS Plasmas Stability”, in Proc. 23th International Workshop on ECR Ion Sources (ECRIS'18), Catania, Italy, Sep. 2018, pp. 214-218.
R. Rácz et al., “Imaging in X-ray Ranges to Locally Investigate the Effect of the Two-Close-Frequency Heating in ECRIS Plasmas”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO01, pp. 27-31.
E. Naselli et al., “High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO02, pp. 32-37.


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