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Author: K. Hoehne


References



Reference
B. Walasek-H?Âhne, P. Forck, K. Hoehne, R. Ischebeck, and G. Kube, “Screens for High Precision Measurements”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 242-248.


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