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Author: L. Bernardi


References



Reference
C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 80-83.
A. Esper et al., “Minimizing disturbance in ion beam profiling with PEPITES monitor”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper THPS097, this conference.


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