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Author: F. Van der Veken


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Reference
R. Tomas et al., “Mitigation of losses at injection protection devices in the CERN LHC”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPL019, pp. 547-550.
A. Frasca et al., “Simulations and measurements of collisional losses with Pb beams at the LHC”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPL029, pp. 582-585.
F. Van der Veken et al., “Collimation performance of the 400MJ LHC beam at 6.8 TeV”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUPM119, pp. 2499-2502.
A. Lasheen et al., “Investigations of losses on the CERN SPS flat bottom with HL-LHC type beams”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUPA153, pp. 1652-1655.
D. Di Croce, M. Giovannozzi, T. Pieloni, M. Seidel, and F. Van der Veken, “Accelerating dynamic aperture evaluation using deep neural networks”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper WEPA097, pp. 2870-2873.
D. Demetriadou, A. Abramov, G. Iadarola, and F. Van der Veken, “Tools for integrated simulation of collimation processes in Xsuite”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper WEPA066, pp. 2801-2804.
I. Efthymiopoulos et al., “Evolution of special LHC optics configurations Run 3 update”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPC16, pp. 83-86.
K. Dewhurst, F. Van der Veken, P. Hermes, D. Mirarchi, and S. Redaelli, “Calculating the channelling efficiency of bent silicon crystals using two particle simulation programs: SixTrack and Xsuite”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper TUPC65, pp. 1148-1151.
G. Iadarola et al., “Xsuite: an integrated beam physics simulation framework”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPR56, pp. 2623-2626.


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