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B. Steffen et al., “Diversity Enhanced Electro-Optic Sampling at EuXFEL”, presented at the 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper TUP013, unpublished. |
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Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 746-749. |
