27th Int. Free Electron Laser Conf. (FEL'05)
Palo Alto, CA, USA, Aug. 2005
References
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Reference
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J. P. Dai, “Design Study of Beijing XFEL Test Facility”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP022, pp. XX-XX. |
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J. P. Dai, “Design Study of Beijing XFEL Test Facility”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP023, pp. XX-XX. |
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N. Thompson, B. W. J. McNeil, and M. W. Poole, “A VUV-FEL for 4GLS: Design Concept and Simulation Results”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP024, pp. XX-XX. |
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J. P. Dai, “Design Study of Beijing XFEL Test Facility”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP025, pp. XX-XX. |
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G. Andonian et al., “Simulations, Diagnostics and Recent Results of the VISA II Experiment”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP026, pp. XX-XX. |
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C. Sung et al., “High-gain Seeded FEL Amplifier Tunable in the Terahertz Range”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP027, pp. XX-XX. |
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H. Freund et al., “Comparative Design Studies for the BESSY FEL Program using the MEDUSA and GENESIS Simulation Codes”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP028, pp. XX-XX. |
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S. Krinsky, “On the Definition of the Number of Temporal Modes in the SASE Output”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP030, pp. XX-XX. |
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T. Watanabe et al., “Experimental Characterization of the Seeded FEL Amplifier at the BNL SDL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP031, pp. XX-XX. |
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P. Michel et al., “Diagnostic Tools for Operation and Optimization of the ELBE-FEL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP032, pp. XX-XX. |
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