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14th Beam Instrumentation Workshop (BIW'10)

Santa Fe, NM, USA, May 2010


References


Reference
B. Gilbert, “Fundamentals Of Logarithmic Amplifiers And Recent Advances”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUTNB01, pp. 68-68.
M. M. Ravindran and J. T. Truchard, “COTS Technology for High Energy Physics Instrumentation”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUVNB01, pp. 84-87.
D. N?Âlle, “Overview of E-XFEL Standard Electron Beam Diagnostics”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WECNB01, pp. 533-537.
B. Steffen, P. Chevtsov, F. M??ller, and V. Schlott, “Electro Optical Sampling of Coherent Synchrotron Radiation for Picosecond Electron Bunches With Few pC Charge”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WECNB02, pp. 538-542.
R. B. Fiorito et al., “Beam Halo Imaging Using an Adaptive Optical Mask”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WECNB03, pp. 543-547.
C. P. Welsch, “DITANET Contributing to State-of-the-Art Diagnostics Developments”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WEDNB01, pp. 548-552.
R. C. McCrady, “LANSCE Beam Instrumentation and the LANSCE Refurbishment Project”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WEIANB01, pp. 516-522.
T. Watanabe, N. Fukunishi, A. Goto, O. Kamigaito, M. Kase, and Y. Sasaki, “Development of Beam Current Monitor with High Tc SQUID at RIBF”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WEIANB02, pp. 523-532.
D. Leitner, “Ion Beam Properties and their Diagnostics for ECR Ion Source Injector Systems”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WEIMNB01, pp. 498-505.
D. Douglas, “An Instrumentation Wish List for High Power/High Brightness ERLs”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper WEIMNB02, pp. 506-515.

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