33rd Int. Free Electron Laser Conf. (FEL'11)
Shanghai, China, Aug. 2011
References
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Reference
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X. Li et al., “Study of the Back-bombardment Effect in the ITC-Rf Gun for t-ACTS Project at Tohoku University”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA17, pp. 503-506. |
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S. Schreiber et al., “Operation of the FLASH Photoinjector Laser System”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA18, pp. 507-510. |
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S. Schreiber et al., “Photocathodes at FLASH”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA19, pp. 511-514. |
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J. Ruan, A. H. Lumpkin, and T. J. Maxwell, “Commissioning of a Streak Camera for Laser Characterization at NML”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA21, pp. 515-518. |
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M. Otevrel et al., “Investigations on Thermal Emittance at PITZ”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA23, pp. 519-522. |
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C. Benabderrahmane et al., “Development of Pr2Fe14B Cryogenic Undulator CPMU at SOLEIL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA24, pp. 523-526. |
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D. Lipka, “Standard Electron Beam Diagnostics for the European XFEL”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA25, pp. 527-530. |
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Ch. Schmidt, M. K. Bock, W. Koprek, S. Pfeiffer, H. Schlarb, and W. Jalmuzna, “Feedback Strategies for Bunch Arrival Time Stabilization at FLASH Towards 10 fs”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA26, pp. 531-534. |
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K. Nakao, K. Hayakawa, Y. Hayakawa, M. Inagaki, K. Nogami, and T. Tanaka, “Lasing of Near Infrared FEL with the Burst-mode Beam at LEBRA”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA28, pp. 535-538. |
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H. Maesaka et al., “Performance of the RF Cavity BPM at XFEL/SPring-8 ``SACLA''”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPA29, pp. 539-542. |
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