15th Beam Instrumentation Workshop (BIW'12)
Newport News, VA, USA, Apr. 2012
References
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Reference
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M. Gasior, “Faraday Cup Award: High Sensitivity Tune Measurement using Direct Diode Detection”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOAP02, pp. XX-XX. |
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J. C. T. Thangaraj et al., “First Results from Commissioning the Real-Time Interferometer as a Bunch-Length Monitor for Sub-mm Electron Bunches”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOBP02, pp. 9-11. |
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M. Kuntzsch et al., “Status of the Femtosecond Synchronization System at ELBE”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOBP03, pp. 12-14. |
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L. Panitzsch, S. Boettcher, M. Stalder, and R. F. Wimmer-Schweingruber, “A New System for Monitoring Transverse Beam Profiles”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOCP03, pp. 15-16. |
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F. Kurian et al., “Field Attenuation of the Magnetic Shield for a Cryogenic Current Comparator”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG001, pp. 17-19. |
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N. Liu, A. Ibrahim, A. Semenov, and M. Wendt, “Digital Signal Processing for Bunched Beam Intensity Measurements”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG002, pp. 20-22. |
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M. M. Ali, M. E. Bevins, P. Degtiarenko, A. Freyberger, and G. A. Krafft, “Precision Absolute Beam Current Measurement of Low Power Electron Beam”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG003, pp. 23-25. |
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D. Padrazo, B. Bacha, Y. Hu, I. Pinayev, and G. M. Wang, “NSLS-II Beam Intensity Measurement”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG004, pp. 26-28. |
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Y. Hu, P. Cameron, D. Chabot, L. R. Dalesio, and S. L. Kramer, “Controls and Data Acquisition for NSLS-II Loss Control and Monitoring”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG005, pp. 29-31. |
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M. Panniello, P. Finocchiaro, S. Mallows, A. Pappalardo, and C. P. Welsch, “Characterization of Detectors for Beam Loss Measurements”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG006, pp. 32-34. |
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