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1st Int. Beam Instrumentation Conf. (IBIC'12)

Tsukuba, Japan, Oct. 2012

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	Reference
	Y. Shoji, K. Takeda, T. Asaka, Y. Minagawa, S. Suzuki, and Y. Takemura, “Electron Storage Ring as a Single Shot Linac Beam Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUCC01, pp. 302-306.
	N. Milas et al., “Design and Expected Performance of the New SLS Beam Size Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUCC03, pp. 307-309.
	J. N. Yan et al., “Measurement of Nanometer Electron Beam Sizes with Laser Interference using IPBSM”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUCC04, pp. 310-314.
	Y. Tanimoto, “Direct Observation of the Dust-trapping Phenomenon”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUIC02, pp. 315-323.
	C. H. Kuo et al., “Diagnostics Update of the Taiwan Photon Source”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA01, pp. 324-328.
	C. H. Kuo et al., “Modernized of the Booster Synchrotron Diagnostics in the Taiwan Light Source”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA02, pp. 329-333.
	Y. L. Yang et al., “The Calibration Factor Determined and Analysis for HLS Bunch Current Measurement System”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA05, pp. 334-336.
	S. D. Dhole, S. Akhter, V. N. Bhoraskar, B. J. Patil, and N. S. Shinde, “Pulsed Electron Beam Current and Flux Monitor for the Race-track Microtron”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA06, pp. 337-340.
	Z. C. Chen, Y. B. Leng, and Y. B. Yan, “BPM Selection for Beam Current Monitoring in SSRF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA07, pp. 341-343.
	M. E. Castro Carballo, “Application of Single Crystal Diamonds (scCVD) as Beam Conditions Monitors at LHC”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA08, pp. 344-346.

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