1st Int. Beam Instrumentation Conf. (IBIC'12)
Tsukuba, Japan, Oct. 2012
References
|
Reference
|
|
J. W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda, T. M. Mitsuhashi, and G. S. Varner, “First Measurements with Coded Aperture X-ray Monitor at the ATF2 Extraction Line”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB72, pp. 237-240. |
|
R. Barday et al., “Beam Size and Intensity Diagnostics for a SRF Photoelectron Injector”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB73, pp. 241-245. |
|
L. Wang, J. Cao, and Z. Zhao, “Beam Measurement with Synchrotron Radiation for BEPCII Storage Ring”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB74, pp. 249-251. |
|
T. Yuyama, I. Ishibori, T. Ishizaka, S. Okumura, and Y. Yuri, “Real-time Beam Profile Measurement System using Fluorescent Screens”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB75, pp. 246-248. |
|
Y. Hara et al., “Evaluation of a Fluorescent Screen with a CCD System for Quality Assurance in Heavy-Ion Beam Scanning Irradiation System”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB76, pp. 249-252. |
|
K. Reimers, V. Kamerdzhiev, and A. Pernizki, “Adjustable Optics for a Non-destructive Beam Profile Monitor based on Scintillation of Residual Gas”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB77, pp. 253-255. |
|
K. Mizushima et al., “Beam Spot Measurement using a Phosphor Screen for Carbon-Ion Therapy at NIRS”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB78, pp. 256-258. |
|
R. Veness et al., “Design of a High-precision Fast Wire Scanner for the SPS at CERN”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB79, pp. 259-262. |
|
P. E. Evtushenko and D. Douglas, “High Dynamic Range Beam Imaging with Two Simultaneously Sampling CCDs”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB80, pp. 263-266. |
|
Y. Sato et al., “Residual Gas Ionization Profile Monitors in J-PARC Slow-extraction Beam Line”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB81, pp. 267-270. |
Back to the list
