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2nd Int. Beam Instrumentation Conf. (IBIC'13)

Oxford, UK, Sep. 2013


References


Reference
M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.
E. Guetlich, O. K. Kester, and P. Forck, “Scintillation Screen Response to Heavy Ion Impact”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF14, pp. 235-238.
P. K. Saha et al., “Advanced uses of a Current Transformer and a Multi-Wire Profile Monitor for Online Monitoring of the Stripper Foil Degradation in the 3-GeV RCS of J-PARC”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF15, pp. 239-242.
L. J. Nevay et al., “Sub-Micrometre Resolution Laserwire Transverse Beam Size Measurement System”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF16, pp. 243-246.
P. E. Evtushenko, “Optical System with Image Intensifier and Spatial Filters for Large Dynamic Range Transverse Beam Profile Measurements”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF17, pp. 247-247.
E. D. van Garderen et al., “Injection Efficiency Monitoring System at the Australian Synchrotron”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF19, pp. 248-251.
H. Jun, J. S. Cao, and J. H. Junhui, “Bunch Purity Measurement for BEPCII”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF20, pp. 252-254.
G. Kourkafas et al., “The Effect of Space Charge Along the Tomography Section at PITZ”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF22, pp. 255-258.
A. F. D. Morgan and G. Rehm, “Quantifying Dissipated Power From Wake Field Losses in Diagnostics Structures”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF23, pp. 259-262.
S. Aguilera, P. Odier, and R. Ruffieux, “Magnetic Materials for Current Transformers”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF24, pp. 263-266.

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