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11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86)

Tokyo, Japan, Oct. 1986


References


Reference
F. Aghion, D. Giove, and G. Cuttone, “The Operator Interface in the Control System for the Milan Superconducting Cyclotron”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I4-08, pp. 432-435.
A. Jankowski, “Proposed Full Automatic Control System for the Medical Small Cyclotron C-30 at the Institute of Nuclear Studies, Poland”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I4-09, pp. 436-439.
G. Q. Zheng, Z. D. Li, F. Q. Liao, and Z. B. Wang, “A Micro-Processor Based Measuring System for Cyclotron”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I4-10, pp. 440-442.
M. Kase, Y. Oikawa, M. Saito, I. Takeshita, Y. Yano, and I. Yokoyama, “Beam Diagnostic Equipments for RIKEN Ring Cyclotron and Its Beam Lines”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-01, pp. 443-446.
S. Watanabe and A. Itano, “Test of Amorphous Core for DC Beam Monitor”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-02, pp. 447-448.
F. Loyer, “On Line Beam Diagnostics at GANIL”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-03, pp. 449-452.
S. Schneider, H. Gargan, W. L. J. Hendrikse, and P. G. Molteno, “The Design and Performance of the Beam Diagnostic System of the NAC Separated-Sector Cyclotron”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-04, pp. 453-456.
L. Rezzonico, “Beam Diagnostics at SIN”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-05, pp. 457-460.
Yu. N. Denisov et al., “Beam Diagnostics Devices at the JINR Phasotron”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-06, pp. 461-464.
P. Bloemhard and Z. Gelbart, “High Current Beam Profile Monitor (Wire Scanner)”, in Proc. 11th Int. Cyclotron Conf. and Their Applications (Cyclotrons'86), Tokyo, Japan, Oct. 1986, paper I5-07, pp. 465-467.

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